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Phase Imaging in STEM Allowing for Post-Acquisition Aberration Correction and 3D Optical Sectioning using Ptychography Wigner-Distribution Deconvolution
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- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 508-509
- Print publication:
- July 2016
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- Article
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The Use of Electron Ptychography to Implement Efficient Phase Imaging in STEM
-
- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 466-467
- Print publication:
- July 2016
-
- Article
-
- You have access
- Export citation